View source for Category:totalreflectionX-rayfluorescencespectrometer


{{#default_form:Instrument}}

URI: [[Equivalent URI::https://vocabulary.actris.nilu.no/actris_vocab/totalreflectionX-rayfluorescencespectrometer]]

label: [[Has preferred property label::total reflection X-ray fluorescence spectrometer@en]]

description: [[Has property description::Measures the elemental composition of a sample by exciting the atoms in the sample with high-energy X-rays, and measuring the energy of the emitted fluorescense X-ray photons, where combination of emission line energies are characteristic for the elements. The incident X-ray beam impinges on the sample at angles of total reflection. This limits the analysis to the surface of the sample, but also limits the background noise of the analysis.@en]]

[[Category:X-rayfluorescencespectrometer]]