Category:particleinducedX-rayemissionspectrometry: Difference between revisions
Andre Castro (talk | contribs) (Created page with " {{#default_form:Instrument}} URI: Equivalent URI::https://vocabulary.actris.nilu.no/actris_vocab/particleinducedX-rayemissionspectrometry label: Has preferred property label::particle induced X-ray emission spectrometry@en label: Has property description::Determines the elemental composition of the surface layer of a sample by exciting atoms with a beam of MeV ions, and measuring the frequency and intensity of induced X-ray emissions.@en Category:ionbe...") |
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label: [[Has preferred property label::particle induced X-ray emission spectrometry@en]] | label: [[Has preferred property label::particle induced X-ray emission spectrometry@en]] | ||
description: [[Has property description::Determines the elemental composition of the surface layer of a sample by exciting atoms with a beam of MeV ions, and measuring the frequency and intensity of induced X-ray emissions.@en]] | |||
[[Category:ionbeamanalysis]] | [[Category:ionbeamanalysis]] | ||
Latest revision as of 10:44, 2 April 2024
This category uses the form Instrument.
URI: https://vocabulary.actris.nilu.no/actris vocab/particleinducedX-rayemissionspectrometry
label: particle induced X-ray emission spectrometry (en)
description: Determines the elemental composition of the surface layer of a sample by exciting atoms with a beam of MeV ions, and measuring the frequency and intensity of induced X-ray emissions. (en)
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