Category:totalreflectionX-rayfluorescencespectrometer: Difference between revisions
Andre Castro (talk | contribs) (Created page with " {{#default_form:Instrument}} URI: Equivalent URI::https://vocabulary.actris.nilu.no/actris_vocab/totalreflectionX-rayfluorescencespectrometer label: Has preferred property label::total reflection X-ray fluorescence spectrometer@en label: Has property description::Measures the elemental composition of a sample by exciting the atoms in the sample with high-energy X-rays, and measuring the energy of the emitted fluorescense X-ray photons, where combination of...") |
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label: [[Has preferred property label::total reflection X-ray fluorescence spectrometer@en]] | label: [[Has preferred property label::total reflection X-ray fluorescence spectrometer@en]] | ||
description: [[Has property description::Measures the elemental composition of a sample by exciting the atoms in the sample with high-energy X-rays, and measuring the energy of the emitted fluorescense X-ray photons, where combination of emission line energies are characteristic for the elements. The incident X-ray beam impinges on the sample at angles of total reflection. This limits the analysis to the surface of the sample, but also limits the background noise of the analysis.@en]] | |||
[[Category:X-rayfluorescencespectrometer]] | [[Category:X-rayfluorescencespectrometer]] | ||
Latest revision as of 10:44, 2 April 2024
This category uses the form Instrument.
URI: https://vocabulary.actris.nilu.no/actris vocab/totalreflectionX-rayfluorescencespectrometer
label: total reflection X-ray fluorescence spectrometer (en)
description: Measures the elemental composition of a sample by exciting the atoms in the sample with high-energy X-rays, and measuring the energy of the emitted fluorescense X-ray photons, where combination of emission line energies are characteristic for the elements. The incident X-ray beam impinges on the sample at angles of total reflection. This limits the analysis to the surface of the sample, but also limits the background noise of the analysis. (en)
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