Category:ionbeamanalysis: Difference between revisions
Andre Castro (talk | contribs) (Created page with " {{#default_form:Instrument}} URI: Equivalent URI::https://vocabulary.actris.nilu.no/actris_vocab/ionbeamanalysis label: Has preferred property label::ion beam analysis@en label: Has property description::Determines the elemental composition of the surface layer of a sample by exposing atoms to a beam of MeV ions.@en Category:instrumenttype") |
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label: [[Has preferred property label::ion beam analysis@en]] | label: [[Has preferred property label::ion beam analysis@en]] | ||
description: [[Has property description::Determines the elemental composition of the surface layer of a sample by exposing atoms to a beam of MeV ions.@en]] | |||
[[Category:instrumenttype]] | [[Category:instrumenttype]] | ||
Latest revision as of 10:44, 2 April 2024
This category uses the form Instrument.
URI: https://vocabulary.actris.nilu.no/actris vocab/ionbeamanalysis
label: ion beam analysis (en)
description: Determines the elemental composition of the surface layer of a sample by exposing atoms to a beam of MeV ions. (en)
Subcategories
This category has the following 5 subcategories, out of 5 total.