Jump to content

GRS Documentation Wiki

Category:ionbeamanalysis

From GRS Documentation Wiki

This category uses the form Instrument.

URI: https://vocabulary.actris.nilu.no/actris vocab/ionbeamanalysis

label: ion beam analysis (en)

description: Determines the elemental composition of the surface layer of a sample by exposing atoms to a beam of MeV ions. (en)

Subcategories

This category has the following 5 subcategories, out of 5 total.

E

elasticbackscatteringspectrometry‎ (empty)

P

particleelasticscatteringspectrometry‎ (empty)
particleinducedgamma-rayemissionspectrometry‎ (empty)
particleinducedX-rayemissionspectrometry‎ (empty)

R

Rutherfordbackscatteringspectrometry‎ (empty)

Retrieved from "https://wiki01.grs.tudelft.nl/index.php?title=Category:ionbeamanalysis&oldid=661"

instrumenttype

Facts

... more about "ionbeamanalysis"

Property description"Property description" is a predefined property that allows to describe a property in context of a language and is provided by Semantic MediaWiki.

Determines the elemental composition of the surface layer of a sample by exposing atoms to a beam of MeV ions. (en) +

Preferred property label"Preferred property label" is a declarative predefined property to specify a preferred property label and is provided by Semantic MediaWiki.

ion beam analysis (en) +

Equivalent URI"Equivalent URI" is a type and predefined property provided by Semantic MediaWiki to represent URI/URL values.

https://vocabulary.actris.nilu.no/actris vocab/ionbeamanalysis +